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Wyko Industrial Inspection Interferometer

Item # :IN001121020

Wyko Industrial Inspection Interferometer Model PZ-06-SC-SF - used to determine film thickness, Non-contact Optical Profiler. Designed for 3-D surface metrology. With TMC High Performance Lab Table model 632478101.

30 day warranty

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Wyco Tool Co.

Wyco Tool Co.


$12,000.00 Good Current

Wyko Industrial Inspection Interferometer

We Enjoy Technical Questions

Sometimes alike products in the Material-Testing - Thickness category give awareness to specifications or product details that help you choose between manufacturers. American Glass Research, Elcometer Inc, Mitutoyo can be much alike in design but even a small difference in models can speed up your research or project goals. Send an inquiry through your cart or give us a call and we can discuss your needs.

Product Manual Library

A collection of Product Manuals is at our disposal. Due to US Copyright law, manuals listed in our library are not for copy, sale and/or redistribution. These manuals are used by HiTechTrader.com to repair and service equipment. They are also utilized to make sure that the parts, accessories, and actual instruments are compatible with our customers’ needs. Specifications on equipment marketplaces, such as Ebay, can lack this critical information. Having access to these manuals allows us to answer customer “needs” questions (i.e.- “Can the software work on Windows XP, Windows 7, Windows 8, or Windows 10?”).

Make : Nanometrics
Model : 215
This manual covers Model 215 operator and process engineer procedures, including power up and initialization, calibration, semi-automatic and fully-automatic testing, and programming tests, stage patterns, and loader operations.
Make : Metricon
Model : 2010
The Metricon Model 2010 Prism Coupler Thin Film Thickness/Refractive Index Measurement System is composed of three major component modules: 1) an optics module which houses the laser; 2) a PC (including VGA video terminal, printer and mouse) which reads in, displays, and analyzes mode patterns and calculates results; and 3) an interface module with attached control pod which connects the optics module and the PC and which incorporates the system's analog amplifiers and step motor drive electronics.

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