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Wyko Industrial Inspection Interferometer

Item # :IN001121020

Wyko Industrial Inspection Interferometer Model PZ-06-SC-SF - used to determine film thickness, Non-contact Optical Profiler. Designed for 3-D surface metrology. With TMC High Performance Lab Table model 632478101.

30 day warranty

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Wyco Tool Co.

PZ-06-SC-SF

$16,500.00
$12,000.00 Good Current

Wyko Industrial Inspection Interferometer



We Enjoy Technical Questions

Sometimes alike products in the Material-Testing - Thickness category give awareness to specifications or product details that help you choose between manufacturers. American Glass Research, Elcometer Inc, Mitutoyo can be almost identical in design but even a minuscule difference in models can propel your research or project goals. Send an inquiry through your cart or give us a call and we can discuss your needs.

Product Manual Library

We have an assortment of Product Manuals at our disposal. Manuals listed in our library are not for copy, sale and/or redistribution, due to US Copyright law. These manuals are used by HiTechTrader.com to make sure that the parts, accessories, and actual instruments are compatible with our customers’ needs. They are also used to repair and maintain equipment. This compatibility is key when buying surplus laboratory or used analytical equipment. Specifications on equipment marketplaces, such as Ebay, can lack this crucial information. Our library allows us to answer customer “needs” questions (i.e.- “Can the software work on Windows XP, Windows 7, Windows 8, or Windows 10?”).

Make : Nanometrics
Model : 215
This manual covers Model 215 operator and process engineer procedures, including power up and initialization, calibration, semi-automatic and fully-automatic testing, and programming tests, stage patterns, and loader operations.
Make : UPA Technology / Unit Process Assemblies
Model : Beta-Backscatter Technology
The UPA Technical Symposium on Advances in Beta-Backscatter Technology for Plating Thickness Measurements details the beta-backscatter phenomenon as used in coating thickness measurements which can be described by an exponential equation. The coating thickness depends on 2 constants and the normalized counts of the sample being measured.

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